Before each observation, a suited preparation of samples is required.

The materials can be observed from macroscopic to microscopic level with different tools:

• digital camera for the macroscopic observation in the range of a few millimeters
• optical microscopy: by reflexion on solid sample, by transmission on thin blades with or without polarization

• Scanning electron microscope: it allows a fine observation of the samples (resolution < 1µm) as well as a semiquantitative analysis of the major elements (atomic number superior or equivalent to the B`s one)
• Scanning electron microscope with field effect : resolution down to 10 angströms
• Atomic force microscopy: tapping mode for 3D cartography