Scanning electron microscopy
The scanning electron microscope coupled with a Link sonde can obtain:

For example, number of applications includes:

picture in topographical contrast (secondary electrons ): revelation of the microscopic texture of the materials.
  • The composition analysis of all mineral or metallic material except for the organic phases
  • The study of material assembly: analysis and observation of the interfaces, identification of the weak points
  • The observation of the surface state
  • The observation of fine textures, determination of gradients of composition and pollution.

picture in chemical contrast (retrodiffused electrons- X emission) revelation of segregated phases;
qualitative and semiquantitative analysis of the elements heavier than B.
The elementary quantitative analysis by EDS ( Emission dispersive spectroscopy) seems to be an economical and fast way for contents of 1%wt at least.
Contact us ...